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Title: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces / Edition 1, Author: Gerd Kaupp
Title: Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution, Author: Tien T. Tsong
Title: Nano and Microstructural Design of Advanced Materials, Author: M. A. Meyers
Title: Photons and Local Probes / Edition 1, Author: Othmar Marti
Title: Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK / Edition 1, Author: A.G. Cullis
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