Title: Using Aspect-Oriented Programming for Trustworthy Software Development / Edition 1, Author: Vladimir O. Safonov
Title: Verification of Systems and Circuits Using LOTOS, Petri Nets, and CCS / Edition 1, Author: Michael Yoeli
Title: Software Fault Tolerance Techniques And Implementation, Author: Laura L Pullum
Title: Designing Maintainable Software / Edition 1, Author: Dennis D. Smith
Title: Verification and Validation for Quality of UML 2.0 Models / Edition 1, Author: Bhuvan Unhelkar
Title: Trust in Technology: A Socio-Technical Perspective / Edition 1, Author: Karen Clarke
Title: Concurrency Verification: Introduction to Compositional and Non-compositional Methods / Edition 1, Author: Willem-Paul de Roever
Title: Guide to Advanced Software Testing / Edition 2, Author: Anne Mette Jonassen Hass
Title: Software Defect and Operational Profile Modeling / Edition 1, Author: Kai-Yuan Cai
Title: Software Quality Control, Error, Analysis, Author: Judith Clapp
Title: Reliability of Software Intensive Systems, Author: Michael A. Friedman
Title: Advanced Techniques for Embedded Systems Design and Test / Edition 1, Author: Juan C. Lïpez
Title: A Practitioner's Guide to Software Test Design / Edition 1, Author: Lee Copeland
Title: Testing Object-Oriented Software: Life Cycle Solutions / Edition 1, Author: Imran Bashir
Title: Temporal Verification of Reactive Systems: Safety / Edition 1, Author: Zohar Manna
Title: Communication Protocol Specification and Verification / Edition 1, Author: Richard Lai
Title: Reliability, Quality and Safety of Software-Intensive Systems: IFIP TC5 WG5.4 3rd International Conference on Reliability, Quality and Safety of Software-Intensive Systems (ENCRESS '97), 29th-30th May 1997, Athens, Greece / Edition 1, Author: Dimitris Gritzalis
Title: Guide to Advanced Software Testing, Author: Anne Mette J. Hass
Title: The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500T / Edition 1, Author: Francisco da Silva
Title: Software Testing and Continuous Quality Improvement / Edition 3, Author: William E. Lewis
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