Advanced Computing in Electron Microscopy

by Earl J. Kirkland

Overview

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Product Details

ISBN-13:	9783030332624
Publisher:	Springer International Publishing
Publication date:	03/09/2020
Edition description:	Third Edition 2020
Pages:	354
Product dimensions:	6.10(w) x 9.25(h) x (d)

About the Author

Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell.

Table of Contents

Introduction.- The Transmission Electron Microscope.- Some Image Approximations.- Sampling and the Fast Fourier Transform.- Calculation of Images of Thin Specimens.- Theory of Calculation of Images of Thick Specimens.- Multislice Applications and Examples.- The Programss.- App. A: Plotting Transfer Functions.- App. B: The Fourier Projection Theorem.- App. C: Atomic Potentials and Scattering Factors.- App. D: The Inverse Problem.- App. E: Bilinear Interpolation.- App. F: 3D Perspective View.

Editorial Reviews

Provides a background on how to use the multislice method to simulate high resolution images in both conventional and scanning transmission electron microscopy. Includes sections on the theory of image formation and simulation, linear image approximations, sampling and the fast Fourier transform, and a practical introduction on how to use the multislice method on real specimens. Intended for first year graduate students and advanced undergraduates in physics or engineering. The CD-ROM contains image simulation programs. Annotation c. by Book News, Inc., Portland, Or.

Booknews

From the reviews of the second edition:

“It is thirteen years since the first edition of Advanced Computing in Electron Microscopy by E.J. Kirkland appeared. … the book contains much guidance in this complex area and the list of references draws attention to many relevant papers that can all too easily be overlooked.” (Ultramicroscopy, Vol. 116, 2012)

From the Publisher