Automated Testing of High-Speed Digital Interfaces

by Jose Moreira, Werkmann. Hubert

Overview

Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses at advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.

Product Details

ISBN-13:	9781607839835
Publisher:	Artech House, Incorporated
Publication date:	07/31/2010
Series:	Artech House Microwave Library (Hardcover)
Pages:	425
Product dimensions:	6.30(w) x 9.30(h) x 1.30(d)

About the Author

José Moreira has extensive experience in the ATE industry, where he has held several positions at Agilent Technologies and Verigy. He is currently a senior engineer at Verigy R&D in Boeblingen, Germany. He has also submitted several patents and published multiple papers in the areas of ATE high-speed digital testing, jitter testing, test fixture design, and focus calibration. Mr. Moreira received an M.S. in electrical and computer engineering from the Instituto Superior Técnico of the Technical University of Lisbon. He is a senior member of the IEEE. Hubert Werkmann is a principal consultant at Verigy Germany GmbH. He has over 20 years of experience in the semiconductor design and test industry with various positions at IMS Chips, Agilent Technologies, and Verigy. Dr. Werkmann has multiple published papers in the areas of scan-based design for testability and ATE high-speed testing of computation and memory devices. Dr. Werkmann received a Diploma degree in computer science and a Ph.D. in engineering from the University of Stuttgart, Germany.

Table of Contents

Introduction. High-Speed Digital Basics. High-Speed Interfaces Standards. ATE Instrumentation for Digital Applications. Tests and Measurements. Production Testing. Support Instrumentation. Test Fixture Design. Advanced ATE Topics. Appendices.