Built-in-Self-Test and Digital Self-Calibration for RF SoCs

by Sleiman Bou-Sleiman, Mohammed Ismail

Overview

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

Product Details

ISBN-13:	9781441995476
Publisher:	Springer New York
Publication date:	09/22/2011
Series:	SpringerBriefs in Electrical and Computer Engineering
Edition description:	2012
Pages:	89
Product dimensions:	6.10(w) x 9.25(h) x 0.36(d)

Table of Contents

Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.