Computer Vision Metrics: Survey, Taxonomy, and Analysis

Computer Vision Metrics: Survey, Taxonomy, and Analysis

by Scott Krig

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Product Details

ISBN-13: 9781430259299
Publisher: Apress
Publication date: 05/30/2014
Edition description: 1st ed.
Pages: 508
Product dimensions: 7.01(w) x 10.00(h) x 0.04(d)

About the Author

Scott Krig is a pioneer in computer imaging, computer vision, and graphics visualization. He founded Krig Research in 1988 (krigresearch.com), providing the world’s first imaging and vision systems based onhigh-performance engineering workstations, super-computers, and dedicated imaging hardware, serving customers worldwide in 25 countries. Scott has provided imaging and vision solutions around the globe, and has worked closely with many industries, including aerospace, military, intelligence, law enforcement, government research, and academic organizations.More recently, Scott has worked for major corporations and startups serving commercial markets, solving problems in the areas of computer vision, imaging, graphics, visualization, robotics, process control, industrial automation, computer security, cryptography, and consumer applications of imaging and machine vision to PCs, laptops, mobile phones, and tablets. Most recently, Scott provided direction for Intel Corporation in the area of depth-sensing and computer vision methods for embedded systems and mobile platforms.Scott is the author of many patent applications worldwide in the areas of embedded systems, imaging, computer vision, DRM, and computer security, and studied at Stanford.

Table of Contents

Chapter 1. Image Capture and Representation

Chapter 2. Image Pre-Processing

Chapter 3. Global and Regional Features

Chapter 4. Local Feature Design Concepts, Classification, and Learning

Chapter 5. Taxonomy Of Feature Description Attributes

Chapter 6. Interest Point Detector and Feature Descriptor Survey

Chapter 7. Ground Truth Data, Data, Metrics, and Analysis

Chapter 8. Vision Pipelines and Optimizations

Appendix A. Synthetic Feature Analysis

Appendix B. Survey of Ground Truth Datasets

Appendix C. Imaging and Computer Vision Resources

Appendix D. Extended SDM Metrics

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