Dimensional Analysis: The principle of similitude

by Jeffrey H Williams

Overview

An accessible, modern, self-contained and systematic overview to dimensional analysis for scientists and engineers. Explains how it can be applied practically to aid y a greater understanding of theoretical concepts, in designing experiments and analysing experimental data. With examples from the physical, biological and engineering sciences.

Product Details

ISBN-13:	9780750336536
Publisher:	Iop Publishing Ltd
Publication date:	03/15/2022
Pages:	140
Product dimensions:	7.41(w) x 10.38(h) x 0.76(d)

About the Author

Following a PhD in chemical physics from Cambridge University, Jeffrey worked as a research scientist in the universities of Cambridge, Oxford, Harvard and Illinois, and subsequently as a physicist at the Institute Laue-Langevin, France. Leaving research Jeffrey moved to the world of science publishing and the communication of science by becoming the European editor for the physical sciences for the AAAS's Science and subsequently, the Assistant Executive Secretary of the International Union of Pure and Applied Chemistry. Most recently, 2003-2008, he was the head of publications at the Bureau International des Poids et Mesures (BIPM), Sèvres. It was during these years at the BIPM that he became interested in and familiar with the origin of the Metric System, its subsequent evolution into the SI, and the coming transformation into the Quantum-SI. At the BIPM, he was the editor of their journal Metrologia. Jeffrey has written widely about science, technology, the impact of science on society and the individual for general-interest magazines such as New Scientist and for more specialized magazines (Chemistry in Britain, Physics Today, Chemical & Engineering News, Physics World and Chemistry and Industry). Jeffrey passed away in July 2021.