Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

by Dong ZhiLi

Overview

The structure–property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.

• Introduces fundamentals of crystallography
• Covers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methods
• Describes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrasts
• Discusses applications of HRTEM in materials research
• Explains concepts used in XRD and TEM lab training

Based on the author’s course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.

Product Details

ISBN-13:	9780367357948
Publisher:	CRC Press
Publication date:	05/24/2022
Series:	Advances in Materials Science and Engineering
Pages:	272
Product dimensions:	6.12(w) x 9.19(h) x (d)

About the Author

Dr. ZhiLi Dong received his B.Eng. degree in metallic materials engineering from Tsinghua University in 1984. Dong obtained his Ph.D. degree from Tsinghua University in 1989 under the Joint Ph.D. Program of the Ministry of Education of China. Dong received the Japanese Government Scholarship and carried out his PhD research at Osaka University in 1987 and 1988.

Dong developed his research in the areas of materials engineering, synthesis of geo-mimetic materials, crystal structure/electronic structure-property relationships, and interface structure analysis. He has more than thirty years’ experience in x-ray diffraction and transmission electron microscopy of materials.

Dong is an Associate Professor in the School of Materials Science & Engineering of Nanyang Technological University. Prior to joining NTU, Dong worked at the Environmental Technology Institute of Singapore as a senior research scientist, School of Mechanical and Production Engineering of NTU as a research fellow, University of Barcelona as a visiting professor, and Tsinghua University as a lecturer.

Table of Contents

Part I: Introduction to Crystallography 1. Periodicity of Crystals and Bravais Lattices 2. Symmetry of Crystals, Point Groups and Space Groups 3. Reciprocal Lattice 4. Examples for Crystal Structure Representation Part Ii: X-ray Diffraction of Materials 5. Geometry of X-ray Diffraction 6. Intensity of Diffracted X-ray Beam 7. Experimental Methods and Powder X-ray Diffractometer 8. Rietveld Refinement of Powder X-ray Diffraction Patterns Part Iii: Transmission Electron Microscopy of Materials 9. Atomic Scattering Factors for Electrons and X-rays 10. Electron Diffraction in Transmission Electron Microscope 11. Diffraction Contrast 12. Phase Contrast