High-Speed Circuit Board Signal Integrity
This engineering reference book covers the theoretical and practical aspects of high-speed digital signalling at the level of the printed circuit board.
1006628756
High-Speed Circuit Board Signal Integrity
This engineering reference book covers the theoretical and practical aspects of high-speed digital signalling at the level of the printed circuit board.
132.0
In Stock
5
1


Hardcover
$132.00
-
SHIP THIS ITEMIn stock. Ships in 1-2 days.PICK UP IN STORE
Your local store may have stock of this item.
Available within 2 business hours
Related collections and offers
132.0
In Stock
Overview
This engineering reference book covers the theoretical and practical aspects of high-speed digital signalling at the level of the printed circuit board.
Product Details
ISBN-13: | 9781580531313 |
---|---|
Publisher: | Artech House, Incorporated |
Publication date: | 02/26/2004 |
Series: | Artech House Microwave Library |
Pages: | 264 |
Product dimensions: | 7.00(w) x 10.00(h) x 0.63(d) |
Table of Contents
Preface | xiii | |
Chapter 1 | Characteristics and Construction of Printed Wiring Boards | 1 |
1.1 | Introduction | 1 |
1.2 | Unit System | 1 |
1.3 | PWB Construction | 2 |
1.3.1 | Resins | 3 |
1.3.2 | Alternate Resin Systems | 3 |
1.3.3 | Reinforcements | 5 |
1.3.4 | Variability in Building Stackups | 6 |
1.3.5 | Mixing Laminate Types | 7 |
1.4 | PWB Traces | 7 |
1.4.1 | Copper Cladding | 8 |
1.4.2 | Copper Weights and Thickness | 9 |
1.4.3 | Plating the Surface Traces | 9 |
1.4.4 | Trace Etch Shape Effects | 9 |
1.5 | Vias | 10 |
1.5.1 | Via Aspect Ratio | 13 |
1.6 | Surface Finishes and Solder Mask | 14 |
1.7 | Summary | 14 |
References | 15 | |
Chapter 2 | Resistance of Etched Conductors | 17 |
2.1 | Introduction | 17 |
2.2 | Resistance at Low Frequencies | 17 |
2.3 | Loop Resistance and the Proximity Effect | 20 |
2.3.1 | Resistance Matrix | 21 |
2.3.2 | Proximity Effect | 22 |
2.4 | Resistance Increase with Frequency: Skin Effect | 24 |
2.5 | Hand Calculations of Frequency-Dependent Resistance | 27 |
2.5.1 | Return Path Resistance | 28 |
2.5.2 | Conductor Resistance | 28 |
2.5.3 | Total Loop Resistance | 29 |
2.6 | Resistance Increase Due to Surface Roughness | 29 |
2.7 | Summary | 30 |
References | 30 | |
Chapter 3 | Capacitance of Etched Conductors | 31 |
3.1 | Introduction | 31 |
3.2 | Capacitance and Charge | 31 |
3.2.1 | Dielectric Constant | 32 |
3.3 | Parallel Plate Capacitor | 33 |
3.4 | Self and Mutual Capacitance | 35 |
3.5 | Capacitance Matrix | 37 |
3.6 | Dielectric Losses | 39 |
3.6.1 | Reactance and Displacement Current | 40 |
3.6.2 | Loss Tangent | 40 |
3.6.3 | Calculating Loss Tangent and Conductance G | 41 |
3.7 | Environmental Effects on Laminate [epsilon subscript r] and Loss Tangent | 43 |
3.7.1 | Temperature Effects | 44 |
3.7.2 | Moisture Effects | 44 |
3.8 | Summary | 45 |
References | 45 | |
Chapter 4 | Inductance of Etched Conductors | 47 |
4.1 | Introduction | 47 |
4.2 | Field Theory | 47 |
4.2.1 | Permeability | 48 |
4.2.2 | Inductance | 48 |
4.2.3 | Internal and External Inductance | 49 |
4.2.4 | Partial Inductance | 49 |
4.2.5 | Reciprocity Principal and Transverse Electromagnetic Mode | 50 |
4.3 | Circuit Behavior of Inductance | 51 |
4.3.1 | Inductive Voltage Drop | 53 |
4.3.2 | Inductive Reactance | 54 |
4.4 | Inductance Matrix | 55 |
4.4.1 | Using the Reciprocity Principle to Obtain the Inductance Matrix from a Capacitance Matrix | 55 |
4.5 | Mutual Inductance | 55 |
4.5.1 | Coupling Coefficient | 56 |
4.5.2 | Beneficial Effects of Mutual Inductance | 57 |
4.5.3 | Deleterious Effects of Mutual Inductance | 59 |
4.6 | Hand Calculations for Inductance | 60 |
4.6.1 | Inductance of a Wire Above a Return Plane | 60 |
4.6.2 | Inductance of Side-by-Side Wires | 61 |
4.6.3 | Inductance of Parallel Plates | 61 |
4.6.4 | Inductance of Microstrip | 63 |
4.6.5 | Inductance of Stripline | 63 |
4.7 | Summary | 64 |
References | 65 | |
Chapter 5 | Transmission Lines | 67 |
5.1 | Introduction | 67 |
5.2 | General Circuit Model of a Lossy Transmission Line | 67 |
5.2.1 | Relationship Between [omega]L and R | 70 |
5.2.2 | Relationship Between [omega]C and G | 70 |
5.3 | Impedance | 71 |
5.3.1 | Calculating Impedance | 72 |
5.4 | Traveling Waves | 73 |
5.4.1 | Propagation Constant | 74 |
5.4.2 | Phase Shift, Delay, and Wavelength | 75 |
5.4.3 | Phase Constant at High Frequencies When R and G Are Small | 78 |
5.4.4 | Attenuation | 79 |
5.4.5 | Neper and Decibel Conversion | 80 |
5.5 | Summary and Worked Examples | 82 |
References | 86 | |
Chapter 6 | Return Paths and Power Supply Decoupling | 87 |
6.1 | Introduction | 87 |
6.2 | Proper Return Paths | 87 |
6.2.1 | Return Paths of Ground-Referenced Signals | 89 |
6.2.2 | Stripline | 90 |
6.3 | Stripline Routed Between Power and Ground Planes | 90 |
6.3.1 | When Power Plane Voltage Is the Same as Signal Voltage | 90 |
6.3.2 | When Power Plane Voltage Differs from Signal Voltage | 93 |
6.3.3 | Power System Inductance | 94 |
6.4 | Split Planes, Motes, and Layer Changes | 95 |
6.4.1 | Motes | 95 |
6.4.2 | Layer Changes | 98 |
6.5 | Connectors and Dense Pin Fields | 98 |
6.5.1 | Plane Perforation | 99 |
6.5.2 | Antipads | 99 |
6.5.3 | Nonfunctional Pads | 102 |
6.5.4 | Guidelines for Routing Through Dense Pin Fields | 103 |
6.6 | Power Supply Bypass/Decoupling Capacitance | 105 |
6.6.1 | Power Supply Integrity | 106 |
6.6.2 | Distributed Power Supply Interconnect Model | 110 |
6.7 | Connecting to Decoupling Capacitors | 112 |
6.7.1 | Via Inductance | 112 |
6.8 | Summary | 114 |
References | 115 | |
Chapter 7 | Serial Communication, Loss, and Equalization | 117 |
7.1 | Introduction | 117 |
7.2 | Harmonic Contents of a Data Stream | 117 |
7.2.1 | Line Spectra | 119 |
7.2.2 | Combining Harmonics to Create a Pulse | 120 |
7.2.3 | The Fourier Integral | 122 |
7.2.4 | Rectangular Pulses with Nonzero Rise Times | 123 |
7.3 | Line Codes | 125 |
7.4 | Bit Rate and Data Rate | 126 |
7.5 | Block Codes Used in Serial Transmission | 128 |
7.6 | ISI | 130 |
7.6.1 | Dispersion | 130 |
7.6.2 | Lone 1-Bit Pattern | 131 |
7.7 | Eye Diagrams | 132 |
7.8 | Equalization and Preemphasis | 134 |
7.8.1 | Preemphasis | 134 |
7.8.2 | Passive Equalizers | 137 |
7.8.3 | Passive RC Equalizer | 139 |
7.9 | DC-Blocking Capacitors | 140 |
7.9.1 | Calculating the Coupling Capacitor Value | 142 |
7.10 | Summary | 145 |
References | 146 | |
Chapter 8 | Single-Ended and Differential Signaling and Crosstalk | 149 |
8.1 | Introduction | 149 |
8.2 | Odd and Even Modes | 149 |
8.2.1 | Circuit Description of Odd and Even Modes | 150 |
8.2.2 | Coupling Coefficient | 153 |
8.2.3 | Stripline and Microstrip Odd- and Even-Mode Timing | 155 |
8.2.4 | Effects of Spacing on Impedance | 157 |
8.3 | Multiconductor Transmission Lines | 158 |
8.3.1 | Bus Segmentation for Simulation Purposes | 159 |
8.3.2 | Switching Behavior of a Wide Bus | 160 |
8.3.3 | Simulation Results for Loosely Coupled Lines | 161 |
8.3.4 | Simulation Results for Tightly Coupled Lines | 162 |
8.3.5 | Data-Dependent Timing Jitter in Multiconductor Transmission Lines | 164 |
8.4 | Differential Signaling, Termination, and Layout Rules | 165 |
8.4.1 | Differential Signals and Noise Rejection | 165 |
8.4.2 | Differential Impedance and Termination | 166 |
8.4.3 | Reflection Coefficient and Return Loss | 170 |
8.4.4 | PWB Layout Rules When Routing Differential Pairs | 172 |
8.5 | Crosstalk | 173 |
8.5.1 | Coupled-Line Circuit Model | 175 |
8.5.2 | NEXT and FEXT Coupling Factors | 177 |
8.5.3 | Using K[subscript b] to Predict NEXT | 178 |
8.5.4 | Using K[subscript f] to Predict FEXT | 179 |
8.5.5 | Guard Traces | 179 |
8.5.6 | Crosstalk Worked Example | 180 |
8.5.7 | Crosstalk Summary | 182 |
8.6 | Summary | 182 |
References | 183 | |
Chapter 9 | Characteristics of Printed Wiring Stripline and Microstrips | 185 |
9.1 | Introduction | 185 |
9.2 | Stripline | 185 |
9.2.1 | Time of Flight | 186 |
9.2.2 | Impedance Relationship Between Trace Width, Thickness, and Plate Spacing | 187 |
9.2.3 | Mask Biasing to Obtain a Specific Impedance | 189 |
9.2.4 | Hand Calculation of Z[subscript o] | 189 |
9.2.5 | Stripline Fabrication | 191 |
9.3 | Microstrip | 193 |
9.3.1 | Exposed Microstrip | 194 |
9.3.2 | Solder Mask and Embedded Microstrip | 196 |
9.4 | Losses in Stripline and Microstrip | 197 |
9.4.1 | Dielectric Loss | 199 |
9.4.2 | Conductor Loss | 199 |
9.5 | Microstrip and Stripline Differential Pairs | 201 |
9.5.1 | Broadside Coupled Stripline | 201 |
9.5.2 | Edge-Coupled Stripline | 204 |
9.5.3 | Edge-Coupled Microstrip | 205 |
9.6 | Summary | 206 |
References | 207 | |
Chapter 10 | Surface Mount Capacitors | 209 |
10.1 | Introduction | 209 |
10.2 | Ceramic Surface Mount Capacitors | 209 |
10.2.1 | Dielectric Temperature Characteristics Classification | 209 |
10.2.2 | Body Size Coding | 211 |
10.2.3 | Frequency Response | 212 |
10.2.4 | Inductive Effects: ESL | 214 |
10.2.5 | Dielectric and Conductor Losses: ESR | 215 |
10.2.6 | Leakage Currents: Insulation Resistance | 218 |
10.2.7 | Electrical Model | 219 |
10.2.8 | MLCC Capacitor Aging | 220 |
10.2.9 | Capacitance Change with DC Bias and Frequency | 221 |
10.2.10 | MLCC Usage Guidelines | 222 |
10.3 | SMT Tantalum Capacitors | 223 |
10.3.1 | Body Size Coding | 223 |
10.3.2 | Frequency Response | 224 |
10.3.3 | Electrical Model | 225 |
10.3.4 | Aging | 225 |
10.3.5 | Effects of DC Bias, Temperature, and Relative Humidity | 225 |
10.3.6 | Failure of Tantalum Capacitors | 226 |
10.3.7 | ESR and Self Heating: Voltage and Temperature Derating | 227 |
10.3.8 | Usage Guidelines | 227 |
10.4 | Replacing Tantalum with High-Valued Ceramic Capacitors | 228 |
References | 230 | |
Appendix | Conversion Factors | 231 |
About the Author | 233 | |
Index | 235 |
From the B&N Reads Blog
Page 1 of