Introduction to Scanning Tunneling Microscopy

by C. Julian Chen

Overview

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

Product Details

ISBN-13:	9780195071504
Publisher:	Oxford University Press
Publication date:	05/20/1993
Series:	Oxford Series in Optical and Imaging Sciences , #4
Pages:	472
Product dimensions:	9.21(w) x 6.14(h) x 1.00(d)

About the Author

C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York

C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York, USA.

Please visit the author's homepage for more information. [add URL as in the HB webpage: http://www.columbia.edu/~jcc2161/]

Table of Contents

Chapter 1. OverviewPart IPrinciplesChapter 2. Tunneling PhenomenaChapter 3. Tunneling Matrix ElementsChapter 4. Atomic ForcesChapter 5. Atomic Forces and TunnelingChapter 6. Nanomete-Scale ImagingChapter 7. Atomic-Scale ImagingChapter 8. Nanomechanical EffectsPart IIInstrumentationChapter 9. Piezoelectic ScannersChapter 10. Vibration IsolationChapter 11. Electronics and ControlChapter 12. Mechanical DesignChapter 13. Tip TreatmentChapter 14. Scanning Tunneling SpectroscopyChapter 15. The Atomic Force MicroscopeChapter 16. Illustrative ApplicationsAppendicesChapter A. Green's FunctionChapter B. Spherical Modified Bessel FunctionsChapter C. Surface symmetryChapter D. Elementary elasticity theory

Editorial Reviews

"The book Introduction to Scanning Tunneling Microscopy by C. Julian Chen serves as an excellent starting point to familiarize newcomers with the field, and at the same time provides an in-depth account of theoretical and practical aspects of SPM for the more experienced user. In my personal experience it is also very useful as a textbook for teaching single-molecule studies, at both the beginners' and the advanced level." — Journal of Applied Crystallography

From the Publisher