The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.
The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.

Introduction to Statistics in Metrology
347
Introduction to Statistics in Metrology
347Paperback(1st ed. 2020)
Product Details
ISBN-13: | 9783030533311 |
---|---|
Publisher: | Springer International Publishing |
Publication date: | 12/01/2020 |
Edition description: | 1st ed. 2020 |
Pages: | 347 |
Product dimensions: | 6.10(w) x 9.25(h) x (d) |