Pub. Date:
Springer New York
Mathematics in Industrial Problems: Part 9 / Edition 1

Mathematics in Industrial Problems: Part 9 / Edition 1

by Avner FriedmanAvner Friedman
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The 9th volume in Avner Friedmans collection of Mathematics in Industrial problems. Fostering interaction between industry and mathematics at the "grass roots" level, the problems presented here arise from models developed by industrial scientists engaged in R&D of new or improved products. Topics explored in this volume include diffusion in porous media and in rubber/glass transition, coating flows, solvation of molecules, semiconductor processing, optoelectronics, photographic images, density-functional theory, sphere packing, performance evaluation, causal networks, electrical well logging, general positioning system, sensor management, pursuit-evasion algorithms, and nonlinear viscoelasticity. Open problems and references are incorporated throughout and the final chapter contains some solutions to problems raised in earlier volumes.

Product Details

ISBN-13: 9781441928573
Publisher: Springer New York
Publication date: 12/06/2010
Series: The IMA Volumes in Mathematics and its Applications , #88
Edition description: Softcover reprint of hardcover 1st ed. 1997
Pages: 210
Product dimensions: 6.10(w) x 9.25(h) x 0.24(d)

Table of Contents

Contents: Sphere packing problems: from the obvious to the puzzling.- The value of performance improvements at constant price/performance.- A diffusion model of droplet absorption.- Information theory and sensor management.- Problems and applications in density-functional theory.- Nonlinear diffusion in coating flows.- A mini-max pursuit evasion algorithm.- Formation of photographic images.- Convective-diffusive lattice-gas models for flow under shear.- Multi-scale problems in modelling semiconductor processing equipment.- Mathematical modeling needs in optoelectronics.- Modeling solvation properties of molecules.- Mathematical problems in high-precision interferometric GPS.- Questions about the Poisson equation in semiconductor problems.- Causal modeling in diagnosing complex industrial equipment.- Mathematical problems in electrical well logging.

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