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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

By R.F. Egerton
Paperback
$64.99
By R.F. Egerton
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This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader t...

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Science & TechnologyEngineeringIndustrial Engineering & Materials ScienceApplied ScienceMaterials Science - General & MiscellaneousMicroscopes & Microscopy - Electron Microscopes