Principles of Semiconductor Network Testing

by Amir Afshar

Overview

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Product Details

ISBN-13:	9780750694728
Publisher:	Elsevier Science
Publication date:	06/05/1995
Series:	Test and Measurement Series
Pages:	350
Product dimensions:	6.00(w) x 9.25(h) x (d)

Table of Contents

Diode and transistor operationIntegrated circuit test basicsDigital logic testNoise identificationOperational amplifier general informationData acquisition devicesDigital signal processingCODEC (Coder/Decoder)

Editorial Reviews

Provides comprehensive information about semiconductor microcircuit test procedures for all levels of semiconductor product and test engineers from entry level up; also usable as a text or supplement in engineering school courses. Outlines the basics of diode and transistor operation, of testing integrated circuits and digital logic, and of identifying and suppressing noise; then explains specific testing procedures for operational amplifiers, data acquisition devices, digital signal processors, and coder/decoders. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Booknews