This book focusses on the spacer engineering aspects of novel MOS-based device–circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations.
This book focusses on the spacer engineering aspects of novel MOS-based device–circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations.
Spacer Engineered FinFET Architectures: High-Performance Digital Circuit Applications
154
Spacer Engineered FinFET Architectures: High-Performance Digital Circuit Applications
154Product Details
| ISBN-13: | 9780367573553 |
|---|---|
| Publisher: | CRC Press |
| Publication date: | 06/30/2020 |
| Pages: | 154 |
| Product dimensions: | 6.12(w) x 9.19(h) x (d) |