Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings

by Andrea Torsello (Editor), Luca Rossi (Editor), Marcello Pelillo (Editor), Battista Biggio (Editor), Antonio Robles-Kelly (Editor)

Overview

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.

The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.

The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

Product Details

ISBN-13:	9783030739720
Publisher:	Springer International Publishing
Publication date:	04/10/2021
Series:	Lecture Notes in Computer Science , #12644
Edition description:	1st ed. 2021
Pages:	378
Product dimensions:	6.10(w) x 9.25(h) x (d)

Table of Contents

Classification and data processing.- Deep learning.- Graph-theoretic methods.- Multimedia analysis and understanding.