Thermomechanical Simulation Methodologies for Advanced Semiconductor Packaging
Entering the post-Moore era, electronic packaging technology has played an increasingly important role in enabling the production of more powerful chips, but such technology faces significant thermomechanical challenges.

It's important to be able understand and predict the thermomechanical reliability of advanced electronic packaging. Traditional trial-and-error approaches are time-consuming, expensive, and often unable to capture the intricacies of real-world operating conditions. Numerical simulation technology, particularly finite element analysis (FEA), can enable precise simulation and analysis of the multi-physics issues in electronic packaging, thereby assisting researchers in electronic packaging product design and reliability assessment.

There is a growing demand for more accurate and efficient simulation techniques to address the thermomechanical challenges faced in advanced electronic packaging. This book compiles the latest advancements in thermomechanical simulation methodologies, empowering researchers and engineers with the knowledge and tools necessary to optimize electronic package designs, predict reliability, and accelerate the development process.

This book showcases various failure types and modes for advanced electronic packaging, in assembly, manufacturing and testing. Each chapter incorporates practical case studies, highlighting real-world applications of simulation methodologies to address complex challenges in electronic packaging. Topics covered include numerical simulation methods for warpage evolution, solder joint fatigue, vibration, and drop impact.

This concise reference on recent developments in the field offer useful insights for researchers and engineers working on electronic packaging and its reliability.

1146946110
Thermomechanical Simulation Methodologies for Advanced Semiconductor Packaging
Entering the post-Moore era, electronic packaging technology has played an increasingly important role in enabling the production of more powerful chips, but such technology faces significant thermomechanical challenges.

It's important to be able understand and predict the thermomechanical reliability of advanced electronic packaging. Traditional trial-and-error approaches are time-consuming, expensive, and often unable to capture the intricacies of real-world operating conditions. Numerical simulation technology, particularly finite element analysis (FEA), can enable precise simulation and analysis of the multi-physics issues in electronic packaging, thereby assisting researchers in electronic packaging product design and reliability assessment.

There is a growing demand for more accurate and efficient simulation techniques to address the thermomechanical challenges faced in advanced electronic packaging. This book compiles the latest advancements in thermomechanical simulation methodologies, empowering researchers and engineers with the knowledge and tools necessary to optimize electronic package designs, predict reliability, and accelerate the development process.

This book showcases various failure types and modes for advanced electronic packaging, in assembly, manufacturing and testing. Each chapter incorporates practical case studies, highlighting real-world applications of simulation methodologies to address complex challenges in electronic packaging. Topics covered include numerical simulation methods for warpage evolution, solder joint fatigue, vibration, and drop impact.

This concise reference on recent developments in the field offer useful insights for researchers and engineers working on electronic packaging and its reliability.

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Thermomechanical Simulation Methodologies for Advanced Semiconductor Packaging

Thermomechanical Simulation Methodologies for Advanced Semiconductor Packaging

by Shuye Zhang, Guoli Sun
Thermomechanical Simulation Methodologies for Advanced Semiconductor Packaging

Thermomechanical Simulation Methodologies for Advanced Semiconductor Packaging

by Shuye Zhang, Guoli Sun

Overview

Entering the post-Moore era, electronic packaging technology has played an increasingly important role in enabling the production of more powerful chips, but such technology faces significant thermomechanical challenges.

It's important to be able understand and predict the thermomechanical reliability of advanced electronic packaging. Traditional trial-and-error approaches are time-consuming, expensive, and often unable to capture the intricacies of real-world operating conditions. Numerical simulation technology, particularly finite element analysis (FEA), can enable precise simulation and analysis of the multi-physics issues in electronic packaging, thereby assisting researchers in electronic packaging product design and reliability assessment.

There is a growing demand for more accurate and efficient simulation techniques to address the thermomechanical challenges faced in advanced electronic packaging. This book compiles the latest advancements in thermomechanical simulation methodologies, empowering researchers and engineers with the knowledge and tools necessary to optimize electronic package designs, predict reliability, and accelerate the development process.

This book showcases various failure types and modes for advanced electronic packaging, in assembly, manufacturing and testing. Each chapter incorporates practical case studies, highlighting real-world applications of simulation methodologies to address complex challenges in electronic packaging. Topics covered include numerical simulation methods for warpage evolution, solder joint fatigue, vibration, and drop impact.

This concise reference on recent developments in the field offer useful insights for researchers and engineers working on electronic packaging and its reliability.

Product Details

ISBN-13: 9781837241408
Publisher: The Institution of Engineering and Technology
Publication date: 06/15/2025
Series: Materials, Circuits and Devices
Pages: 199
Product dimensions: 6.14(w) x 9.21(h) x (d)

About the Author

Shuye Zhang is an associate professor at Harbin Institute of Technology, China. He has been working on electronic packaging areas for 15 years. Currently, he is working on heterogeneous integration, 2.5D packaging, and solder joint reliability.


Guoli Sun is currently pursuing a Ph.D. at Harbin Institute of Technology, where his research focuses on material and structural reliability in advanced electronic packaging, as well as the mechanical characterization and performance analysis of various materials.

Table of Contents

  • Chapter 1: Advanced semiconductor electronic packaging
  • Chapter 2: Warpage evolution of TSV wafer based on a hierarchy multiscale analysis method
  • Chapter 3: Investigation on fatigue life of solder joints for 2.5D packaging structures
  • Chapter 4: Molding process simulation of substrates
  • Chapter 5: Structural integration simulation under vibration for PBGA packaging
  • Chapter 6: Electromigration simulation study of copper interconnects in 3D packaging
  • Chapter 7: Study on the influence of mechanical properties of TSV-Cu on cracking in TSV/RDL interconnect structures
  • Chapter 8: Mechanical response of solder joints under drop impact loads
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