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Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS / Edition 1

Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS / Edition 1

Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS / Edition 1
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ISBN-10:
3110456214
ISBN-13:
9783110456219
Pub. Date:
12/17/2018
Publisher:
De Gruyter
ISBN-10:
3110456214
ISBN-13:
9783110456219
Pub. Date:
12/17/2018
Publisher:
De Gruyter
Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS / Edition 1

Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS / Edition 1

Overview

Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use.

This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.

Product Details

ISBN-13: 9783110456219
Publisher: De Gruyter
Publication date: 12/17/2018
Series: De Gruyter STEM
Pages: 347
Product dimensions: 6.69(w) x 9.45(h) x (d)
Age Range: 18 Years

About the Author

Robert Dinnebier, MPI for Solid State Res., Ger.; Andreas Leineweber, TU Bergakademie Freiberg, Ger.; John S.O. Evans, Durham Univ., UK.

Table of Contents

- Basics of powder diffraction
- The Rietveld formula
- Whole Powder Pattern Fitting (Pawley, LeBail, Rietveld)
- Concept of Convolution
- Deriving the instrumental resolution function
- Global versus local optimization
- Structure determination
- Fourier analysis
- Isotropic and anisotropic microstructural properties
- Rigid bodies, constraints, restraints
- Sequential versus parametric Rietveld refinement
- Symmetry and rotational modes
- Modelling stacking faults
- Quantitative phase analysis
- Determination of amorphous content
- Agreement factors
- Macro programming

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