Advances in Imaging and Electron Physics

by Martin Hÿtch (Editor), Peter W. Hawkes (Editor)

Overview

Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.

• Provides the authority and expertise of leading contributors from an international board of authors
• Presents the latest release in the Advances in Imaging and Electron Physics series
• Updated release includes the latest information on the Coulomb Interactions in Charged Particle Beams

Product Details

ISBN-13:	9780323915069
Publisher:	Elsevier Science
Publication date:	06/10/2021
Series:	ISSN
Sold by:	Barnes & Noble
Format:	eBook
Pages:	276
File size:	31 MB
Note:	This product may take a few minutes to download.

About the Author

Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

Contributors     vii
Preface     ix
Future Contributions     xi
Reconstruction Algorithms for Computed Tomography   Claas Bontus   Thomas Kohler
Introduction     2
Principles of Computed Tomography     4
CT Reconstruction     15
Outlook     59
References     61
Color Spaces and Image Segmentation   Laurent Busin   Nicolas Vandenbroucke   Ludovic Macaire
Introduction     66
Color Spaces     66
Color Image Segmentation     110
Relationships between Segmentation and Color Spaces     140
Conclusion     161
References     162
Generalized Discrete Radon Transforms and Applications to Image Processing   Glenn R. Easley   Flavia Colonna
Introduction     170
Background on Wavelets     179
Beyond Wavelets     190
The Discrete p-Adic Radon Transform     197
Generalized Discrete Radon Transform     204
Noise Removal Experiments     217
Applications to Image Recognition     221
Recognition Experiments     230
Conclusion     231
References     235
Lie Algebraic Methods in Charged Particle Optics   Tomas Radlicka
Introduction     242
Trajectory Equations     245
The Field Computation     251
Trajectory Equations: Solution Methods     257
The Analytic Perturbation Method     273
The Symplectic Classification of Geometric Aberrations     310
Axial Symmetric Aberrations of the Fifth Order     338
References     360
Recent Developments in Electron Backscatter Diffraction   Valerie Randle
Introduction     363
Fundamental Aspects of EBSD     364
The Orientation Map and Data Processing     374
Established Applications of EBSD     380
Recent Advances in EBSD     382
Advances in EBSD Technology     388
Trends in EBSD Usage     410
References     411
Index     417

What People are Saying About This

From the Publisher

Edited by one of the best scientists in the field, this series presents updates in the fields of imaging and electron physics

Editorial Reviews

The four surveys contained in this volume illustrate widely diverse aspects of imaging and electron physics. The first two chapters address applications of electron microscopy, including the role of this technique in mineralogy and a study of the high- resolution electron microscopy of quasicrystals. The latter is actually a short monograph presenting the underlying crystallography and explaining in detail how the corresponding images and diffraction patterns should be interpreted. The third contribution is an account of a new approach to deconvolution in image processing in which the author, by associating a polynomial with the gray-level values of (discrete) images, shows that it is possible to invert the convolutional relation that describes many kinds of image formation. The volume ends with a detailed discussion of the dual de Broglie wave, including a critical account of new developments in the debate over the existence and role of such a wave. Annotation c. by Book News, Inc., Portland, Or.

Booknews

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. The Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
—J.A. Chapman in LABORATORY PRACTICE

From the Publisher