Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits / Edition 1

by Gordon W. Roberts, Albert K. Lu

Overview

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Product Details

ISBN-13:	9780792395645
Publisher:	Springer US
Publication date:	04/30/1995
Series:	The Springer International Series in Engineering and Computer Science , #312
Edition description:	1995
Pages:	122
Product dimensions:	5.98(w) x 9.02(h) x 0.24(d)

Table of Contents

1 Introduction.- 1.1 Motivation.- 1.2 Conventional Analog Signal Generation.- 1.3 Digital Signal Generation.- 1.4 Design Constraints.- 2 An Oversampling-Based Analog Oscillator.- 2.1 Motivation.- 2.2 Background Theory.- 2.3 An Area-Efficient Oscillator Circuit.- 2.4 Simulation Results.- 2.5 Experimental Results.- 3 Analog Multi-Tone Signal Generation.- 3.1 Motivation.- 3.2 Addition of Delta-Sigma Modulated Signals.- 3.3 Multi-Tone Circuit Configurations.- 3.4 An Area-Efficient Multi-Tone Oscillator.- 3.5 Simulation Results.- 3.6 Experimental Results.- 4 An Oversampling-Based Function Generator.- 4.1 Motivation.- 4.2 Primary Building Blocks.- 4.3 An Area-Efficient Function Generator.- 4.4 Simulation Results.- 4.5 Experimental Results.- 5 Conclusion.- 5.1 Discussion of Results.- 5.2 Topics of Future Research.- A Delta-Sigma Modulation.- A.1 Principles of Single-Bit Delta-Sigma Modulation.- A.2 A Frequency Domain Perspective: Noise-Shaping.- B VHDL Description: Single-Tone Oscillator.- B.1 The Oscillator.- C Verilog Description: Single-Tone Oscillator.- C.1 The Oscillator.- C.2 Oscillator Test Routine.- D Hsipce Reconstruction Program.- D.1 CD2SP.C.- D.2 Sample HSPICE Input File.- References.

Editorial Reviews

Demonstrates a method by which high-precision analog waveforms can be generated on chip, with minimal silicon overhead, using a digital oversampling-based oscillator, for use in testing digital integrated circuits (ICs). Introduces the testing problem and conventional signal generation techniques, and details the method and equipment and its application in multi-tone signal generation and testing. Also discusses piece-wise linear waveforms and delta-sigma modulation techniques. Includes b&w diagrams and appendices of source code. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Booknews