Crystallographic Instrumentation

by L. A. Aslanov, G. V. Fetisov, J. A. K. Howard

Overview

Innovations in crystallographic instrumentation and the rapid development of methods of diffraction measurement have led to a vast improvement in our ability to determine crystal and molecular structure. This up-to-date resource will allow the reader to harness the potential of X-ray diffraction instruments. Different sources of X-radiation used in crystallography are introduced, including synchrotron radiation, as well as a systematic review of detectors for X-rays and basic instruments for single crystal and powder diffractometry. The principles of the diffraction experiment are discussed and related to their practical application with a comparative description of different scan procedures. Diffraction data collection and processing are also reviewed and methods for error correction are described. This book will provide a useful guide for researchers and students starting in this area of science, as well as skilled crystallographers.

Product Details

ISBN-13:	9780198559276
Publisher:	International Union of Crystallography
Publication date:	07/16/1998
Series:	International Union of Crystallography Monographs on Crystallography , #7
Pages:	328
Product dimensions:	6.20(w) x 9.30(h) x 0.90(d)

About the Author

both at Moscow State University

University of Durham

Table of Contents

1. Radiation used in Crystallography2. Principle of the Diffraction Experiment3. Fundamental Techniques for X-ray Diffractometry4. Single-crystal X-ray Diffractometry5. Single Crystal Diffraction Data Collection and primary Processing6. Primary Data Reduction and Error Correction in Single-Crystal Diffractometry7. Defects in Crystals and their Influence on X-ray Structure Analysis8. Auxiliary MethodsReferencesSubject Index1. Radiation used in Crystallography2. Principle of the Diffraction Experiment3. Fundamental Techniques for X-ray Diffractometry4. Single-crystal X-ray Diffractometry5. Single Crystal Diffraction Data Collection and primary Procesing6. Primary Data Reduction and Error Correction in Single-Crystal Diffractometry7. Defects in Crystals and their Influence on X-ray Structure Analysis8. Auxiliary MethodsReferencesSubject Index