New, updated and expanded topics in the fourth edition include: EBCDIC, Grey code, practical applications of flip-flops, linear and shaft encoders, memory elements and FPGAs. The section on fault-finding has been expanded. A new chapter is dedicated to the interface between digital components and analog voltages.
*A highly accessible, comprehensive and fully up to date digital systems text
*A well known and respected text now revamped for current courses
*Part of the Newnes suite of texts for HND/1st year modules
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About the Author
R.C. Woods was born in Leicester, England, and was awarded the B.A. and M.A. degrees in Physics by New College, Oxford University. He then worked in the Clarendon Laboratory, Oxford University, on magnetic resonance in rare earth metal alloys, and was awarded the D.Phil. degree in 1980. Next followed a period as a Research Assistant in the Engineering Science Department at the University of Oxford, where he worked on surface-acoustic wave devices. From 1982 to 1983, he was Senior Scientist at Plessey Research (Caswell) Ltd., Towcester, specialising in semiconductor lasers and LED systems. He was then a Lecturer (and subsequently Senior Lecturer) in Electronic and Electrical Engineering at the University of Sheffield, and in 2001 he was appointed Full Professor of Electrical and Computer Engineering at Iowa State University, Ames, Iowa. He currently has research interests in magnetic recording, novel solid-state devices, and device modelling, and he has authored more than 70 refereed research publications in these fields. He has been in charge of courses on Digital Systems and Semiconductor Devices for many years.
Table of ContentsNumber systems and codes; Boolean algebra; Karnaugh maps and function simplification; Combinational logic design principles; Combinational logic design with MSI; Latches and flip-flops; Counters and generators; Clock-driven sequential circuits; Event-driven circuits; Instrumentation and interfacing; Programmable logic devices; Arithmetic circuits; Fault diagnosis and testing; Appendix - Functional logic symbols; Answers to problems; Bibliography; Index.