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9780198500742
High Energy Electron Diffraction and Microscopy available in Hardcover

High Energy Electron Diffraction and Microscopy
by L.M. Peng, S.L. Dudarev, M.J. Whelan
L.M. Peng
- ISBN-10:
- 0198500742
- ISBN-13:
- 9780198500742
- Pub. Date:
- 03/11/2004
- Publisher:
- Oxford University Press
- ISBN-10:
- 0198500742
- ISBN-13:
- 9780198500742
- Pub. Date:
- 03/11/2004
- Publisher:
- Oxford University Press

High Energy Electron Diffraction and Microscopy
by L.M. Peng, S.L. Dudarev, M.J. Whelan
L.M. Peng
Hardcover
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Overview
High Energy Electron Diffraction and Microscopy provides a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.
Product Details
ISBN-13: | 9780198500742 |
---|---|
Publisher: | Oxford University Press |
Publication date: | 03/11/2004 |
Series: | Monographs on the Physics and Chemistry of Materials , #61 |
Pages: | 558 |
Product dimensions: | 9.21(w) x 6.14(h) x 1.19(d) |
About the Author
Peking University
EURATOM/UKAEA Fusion Association, Culham Science Centre, Oxfordshire
Oxford University
Table of Contents
1 | Basic concepts of high-energy electron diffraction | 1 |
1.1 | Introduction | 1 |
1.2 | The interaction between high-energy electrons and a solid | 2 |
1.3 | Elastic and inelastic scattering, and the complex potential | 3 |
1.4 | The amplitude and the differential cross-section of scattering of electrons | 4 |
1.5 | Elastic scattering by a time-independent potential--the one-body Schrodinger equation | 6 |
1.6 | Selected area electron diffraction (SAED), convergentbeam electron diffraction (CBED), and Kikuchi patterns | 8 |
1.7 | Scattering by time-dependent fluctuations of the potential | 11 |
1.8 | Damping of coherence in inelastic scattering and the validity of the optical potential | 14 |
1.9 | Relativistic corrections | 17 |
1.10 | Probability current density and conservation of probability | 18 |
1.11 | Correlation between theory and experiment | 19 |
1.12 | Summary | 21 |
2 | Kinematic theory | 24 |
2.1 | Introduction | 24 |
2.2 | Kinematic and quasi-kinematic diffraction theory | 25 |
2.2.1 | Kinematic diffraction | 25 |
2.2.2 | Quasi-kinematic diffraction | 27 |
2.3 | Scattering by a single atom | 27 |
2.4 | Amplitude of scattering by an assemblage of atoms | 33 |
2.5 | Diffraction by single crystals | 36 |
2.6 | Diffraction by a gas, an amorphous solid, and a liquid | 42 |
2.7 | Diffraction by polycrystals and textures | 45 |
2.8 | Fluctuation microscopy | 48 |
2.9 | Summary | 52 |
3 | Dynamical theory I. General theory | 54 |
3.1 | Introduction | 54 |
3.2 | Role of symmetry in dynamical diffraction | 55 |
3.3 | Forward and backward scattering | 59 |
3.4 | The multislice method | 60 |
3.5 | The general matrix method | 63 |
3.5.1 | Fundamental equations | 64 |
3.5.2 | The dispersion surface | 65 |
3.5.3 | Translation properties of Bloch waves | 66 |
3.5.4 | Boundary conditions and formal solutions | 69 |
3.6 | Summary | 74 |
4 | Dynamical theory II. Transmission high-energy electron diffraction | 75 |
4.1 | Introduction | 75 |
4.2 | Diffraction geometry | 75 |
4.3 | Basic concepts and the treatment of ZOLZ diffraction | 79 |
4.3.1 | Basic equations and Bloch waves | 79 |
4.3.2 | Bound and free Bloch waves | 81 |
4.3.3 | Dispersion surfaces and band structure | 84 |
4.3.4 | Excitation of Bloch waves | 86 |
4.3.5 | Two and few Bloch wave approximations | 90 |
4.3.6 | Propagation of Bloch waves | 96 |
4.3.7 | Effects of absorption | 97 |
4.4 | The general treatment of THEED and HOLZ diffraction | 98 |
4.4.1 | Kinematic geometry of HOLZ diffraction | 98 |
4.4.2 | Formation of a HOLZ ring | 98 |
4.4.3 | Distribution of intensity in HOLZ patterns | 102 |
4.4.4 | General treatment of HOLZ diffraction | 107 |
4.5 | Summary | 115 |
5 | Dynamical theory III. Reflection high-energy electron diffraction | 117 |
5.1 | Introduction | 117 |
5.2 | Surface structure notation and RHEED geometry | 118 |
5.2.1 | The nature of the surface | 118 |
5.2.2 | The five surface nets | 119 |
5.2.3 | The relation between the surface mesh and the substrate mesh | 119 |
5.2.4 | Surface reciprocal lattice rods | 121 |
5.3 | RHEED theory | 123 |
5.3.1 | The THEED approach to RHEED | 123 |
5.3.2 | The semi-reciprocal formulation | 126 |
5.3.3 | The Green's function approach | 130 |
5.3.4 | The Bloch wave method | 138 |
5.4 | Worked examples | 159 |
5.4.1 | RHEED from the surface of a metal: the Ag(001) surface | 160 |
5.4.2 | RHEED from a surface of an ionic crystal: the NiO(001) and UO[subscript 2](111) surfaces | 164 |
5.5 | RHEED from growing surfaces: intensity oscillations | 175 |
5.6 | Summary | 185 |
6 | Resonance effects in transmission and reflection high-energy electron diffraction | 186 |
6.1 | The origin of resonances | 186 |
6.2 | Transmission resonance diffraction of high-energy electrons | 187 |
6.2.1 | The geometry of transmission resonance diffraction | 188 |
6.2.2 | Transmission resonance: a formal solution | 191 |
6.2.3 | Transmission resonance: diffraction via tightly bound states | 193 |
6.3 | Resonance diffraction from a crystal surface | 200 |
6.3.1 | The geometry of surface resonance scattering | 202 |
6.3.2 | The two-rod approximation | 204 |
6.3.3 | Resonance scattering via a surface state | 208 |
6.3.4 | Resonance diffraction via localized bulk states | 213 |
6.3.5 | Interference between resonance and potential scattering | 217 |
6.3.6 | The time delay of the incident electron in the resonance state | 223 |
6.4 | Summary | 227 |
7 | Diffuse and inelastic scattering--Elementary processes | 228 |
7.1 | Diffuse and inelastic scattering | 228 |
7.2 | The distorted wave Born approximation | 230 |
7.3 | Diffuse scattering by point defects | 235 |
7.4 | The Van Hove dynamic form factor | 241 |
7.5 | Thermal diffuse scattering | 246 |
7.6 | Electron energy losses | 251 |
7.6.1 | Plasmons | 254 |
7.6.2 | Ionization of inner electronic shells | 256 |
7.6.3 | The extended energy loss fine structure (EXELFS) | 259 |
7.7 | Summary | 263 |
8 | Diffuse and inelastic scattering--Multiple scattering effects | 264 |
8.1 | Introduction | 264 |
8.2 | Breakdown of the DWBA and the optical potential model | 266 |
8.3 | Diffraction and multiple incoherent scattering of electrons | 268 |
8.4 | Kinetic equation for the density matrix | 269 |
8.5 | Loss of coherence due to multiple scattering by plasmons | 274 |
8.6 | Diffraction of diffusely scattered electrons: the formation of Kikuchi lines and bands | 282 |
8.7 | Kikuchi patterns in electron backscattering | 287 |
8.8 | Multiple diffuse scattering: an exact solution of the backscattering problem | 290 |
8.9 | Electron channelling patterns and channelling imaging of crystal defects | 296 |
8.10 | Diffraction effects in inner-shell ionization, X-ray, and Auger electron production | 304 |
8.11 | Summary | 310 |
9 | Crystal and diffraction symmetry | 311 |
9.1 | Introduction | 311 |
9.2 | Representation of symmetry | 312 |
9.3 | The reciprocity principle | 313 |
9.4 | Symmetry elements and their identification | 314 |
9.5 | Diffraction symmetry--a formal derivation | 318 |
9.5.1 | Basic solutions and relations | 318 |
9.5.2 | Effect of the space group symmetry | 320 |
9.5.3 | Diffraction groups and the symmetry of CBED patterns | 323 |
9.5.4 | Derivation of the fundamental symmetry relations | 326 |
9.6 | Crystal point group determination | 330 |
9.7 | Crystal space group determination | 332 |
9.7.1 | Formation of G-M lines | 333 |
9.7.2 | Identification of G-M lines | 336 |
9.7.3 | Space group determination | 337 |
9.8 | Automated identification of CBED pattern symmetry | 337 |
9.8.1 | Genetic algorithm--basic concepts and implementation | 339 |
9.8.2 | Identification of CBED pattern symmetry | 344 |
9.9 | Summary | 348 |
10 | Perturbation methods and tensor theory | 350 |
10.1 | Introduction | 350 |
10.2 | Perturbation treatment of a periodic structure | 353 |
10.2.1 | Bloch waves, left-hand, and right-hand eigenvectors | 354 |
10.2.2 | Non-degenerate perturbation theory | 355 |
10.2.3 | First-order perturbation | 356 |
10.2.4 | Second-order perturbation | 357 |
10.3 | Tensor THEED | 358 |
10.4 | Direct inversion of THEED data | 362 |
10.4.1 | Inversion of crystal structure factors | 364 |
10.4.2 | Inversion of atomic coordinates | 370 |
10.5 | Perturbation methods for non-periodic structures | 379 |
10.5.1 | The DWBA treatment of diffraction by a non-periodic structure | 379 |
10.6 | Tensor RHEED and the direct inversion of a surface structure | 383 |
10.7 | Summary | 386 |
11 | Digital electron micrograph recording and basic processing | 388 |
11.1 | Introduction | 388 |
11.2 | Basic features of CCDs | 389 |
11.3 | A basic model of an SSC camera | 390 |
11.4 | Main characteristics of an SSC camera | 391 |
11.4.1 | The overall gain | 391 |
11.4.2 | Resolution and the point spread function | 393 |
11.4.3 | The detection quantum efficiency | 395 |
11.5 | The sampling theorem | 398 |
11.6 | Discrete and fast Fourier transform | 399 |
11.6.1 | Discrete Fourier transform | 399 |
11.6.2 | Fast Fourier transform (FFT) | 401 |
11.7 | Restoration of images | 402 |
11.7.1 | Generation of data points in reciprocal space | 402 |
11.7.2 | Generation of data points in real space | 404 |
11.8 | Summary | 404 |
12 | Image formation and the retrieval of the electron wave function | 406 |
12.1 | Introduction | 406 |
12.2 | Electron source and coherence | 406 |
12.2.1 | Partial coherence and the complex degree of coherence | 406 |
12.2.2 | Temporal coherence | 408 |
12.2.3 | Spatial coherence | 410 |
12.3 | Image formation in an electron microscope | 412 |
12.3.1 | Transmission cross-coefficient (TCC) for coherent illumination | 413 |
12.3.2 | The TCC for incoherent illumination | 415 |
12.3.3 | The TCC for a partially coherent illumination | 417 |
12.4 | Exit electron wave function retrieval | 418 |
12.4.1 | Linear image retrieval | 419 |
12.4.2 | Non-linear image retrieval | 424 |
12.5 | Summary | 426 |
13 | The atomic scattering factor and the optical potential | 427 |
13.1 | Introduction | 427 |
13.2 | The optical potential | 429 |
13.3 | The averaged potential | 432 |
13.3.1 | Thermally averaged potential | 432 |
13.3.2 | Electron atomic scattering factor | 433 |
13.3.3 | Temperature factor | 434 |
13.4 | The absorptive potential | 437 |
13.5 | Computation of the complex structure factor | 440 |
13.5.1 | A worked example: strontium titanate | 441 |
13.6 | Analytical representation of atomic scattering factors | 443 |
13.6.1 | The parameterization of the elastic atomic scattering factor for electrons | 444 |
13.6.2 | Parameterization of the absorptive atomic scattering factor | 446 |
13.7 | Analytical expressions for the optical potential of atoms and crystals | 447 |
13.8 | Summary | 449 |
14 | Temperature-dependent Debye-Waller factors | 454 |
14.1 | Introduction and definitions | 454 |
14.2 | Debye-Waller factors of elemental crystals | 456 |
14.3 | Debye-Waller factors of cubic compounds | 458 |
14.4 | Summary | 460 |
A | Some useful mathematical relations | 470 |
A.1 | Fourier transformation | 470 |
A.2 | The Dirac delta function | 470 |
A.3 | The Kronecker delta symbol | 471 |
A.4 | Some useful integrals | 472 |
B | Green's functions | 473 |
C | FORTRAN listing of RHEED routines | 477 |
C.1 | A FORTRAN routine for the calculation of U[subscript G](z) | 477 |
C.1.1 | The input file for the calculation of U[subscript G](z) | 477 |
C.1.2 | FORTRAN routine for calculating U[subscript G](z) | 477 |
C.2 | A FORTRAN routine for dynamical RHEED calculations | 481 |
C.2.1 | Example input data file for dynamical RHEED calculations | 482 |
C.2.2 | A FORTRAN routine for dynamical RHEED calculations | 482 |
D | Parameterization of the electron atomic scattering factor | 490 |
D.1 | The parameterization algorithm | 490 |
D.2 | The absorptive atomic scattering factor | 496 |
References | 501 | |
Subject Index | 531 |
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