Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
Mostly physicists, but also mathematicians and chemists from countries around the world report on recent trends and findings in the technique. Among the innovations they discuss are the secondary ion mass spectrometry based on highly charged ions, the analysis of liquid surfaces, and the analysis of surface-alloys that are only one atomic layer thick. Among the 11 topics are also Rutherford backscattering spectrometry, the channeling analysis of self-assembled structures, light emission from sputtered particles, and bombardment-induced topography on semiconductor surfaces. Annotation ©2003 Book News, Inc., Portland, OR
1005501495
Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
Mostly physicists, but also mathematicians and chemists from countries around the world report on recent trends and findings in the technique. Among the innovations they discuss are the secondary ion mass spectrometry based on highly charged ions, the analysis of liquid surfaces, and the analysis of surface-alloys that are only one atomic layer thick. Among the 11 topics are also Rutherford backscattering spectrometry, the channeling analysis of self-assembled structures, light emission from sputtered particles, and bombardment-induced topography on semiconductor surfaces. Annotation ©2003 Book News, Inc., Portland, OR
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Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
445
Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
445Hardcover
$110.00
110.0
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Product Details
| ISBN-13: | 9781590335383 |
|---|---|
| Publisher: | Nova Science Publishers, Incorporated |
| Publication date: | 11/01/2002 |
| Pages: | 445 |
| Product dimensions: | 7.09(w) x 10.24(h) x (d) |
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