Memory, Microprocessor, and ASIC

by Wai-Kai Chen (Editor)

Overview

Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons

Product Details

ISBN-13:	9781135499259
Publisher:	CRC Press
Publication date:	03/26/2003
Series:	Principles and Applications in Engineering
Sold by:	Barnes & Noble
Format:	eBook
Pages:	384
File size:	19 MB
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About the Author

Wai-Kai Chen

Table of Contents

System Timing. ROM/PROM/EPROM. SRAM. Embedded Memory. Flash Memories. Dynamic Random Access Memory. Low-Power Memory Circuits. Timing and Signal Integrity Analysis. Microprocessor Design Verification. Microprocessor Layout Method. Architecture. ASIC Design. Logic Synthesis for Field Programmable Gate Array (EPGA) Technology. Testability Concepts and DFT. ATPG and BIST. CAD Tools for BIST/DFT and Delay Faults.