Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology

by Petr Klapetek

Overview

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ - Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques - Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy - Worked examples show quantitative data processing for different SPM analytical techniques

Product Details

ISBN-13:	9780128133484
Publisher:	Elsevier Science
Publication date:	02/03/2018
Series:	Micro and Nano Technologies
Sold by:	Barnes & Noble
Format:	eBook
Pages:	416
File size:	55 MB
Note:	This product may take a few minutes to download.

About the Author

Petr Klapetek is Head, Department of Nanometrology at the Czech Metrology Institute, Czech Republic. His research focuses on the metrology scanning probe microscope (SPM) construction, a key standard for nanometrology.He also participates in the Gwyddion project, focused on the creation of multiplatform open-source software for scanning probe microscopy (SPM) data analysis.

Table of Contents

Introduction to SPM; Data models; Basic SPM data processing; Dimensional measurements; Mechanical properties; Local current measurements; Electric and magnetic measurements; Thermal measurements; Optical measurements.

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From the Publisher

Petr Klapatek unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings