Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation

by Yannick Deshayes, Laurent Bechou

Overview

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. - Deals exclusively with reliability, based on the physics of failure for infrared LEDs - Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications - Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution - Focuses on the method to extract fundamental parameters from electrical and optical characterizations

Product Details

ISBN-13:	9780081010884
Publisher:	ISTE Press - Elsevier
Publication date:	03/27/2017
Sold by:	Barnes & Noble
Format:	eBook
Pages:	172
File size:	15 MB
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About the Author

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices. He develops quantum theory to establish degradation laws on photonics devices for LED, laser and photonics applications..Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.

Table of Contents

1: State-of-the-Art of Infrared Technology 2: Analysis and Models of an LED 3: Physics of Failure Principles 4: Methodologies of Reliability Analysis

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From the Publisher

This practical resource examines several methods for determining the reliability of infrared LED devices, identifying different parameters related to specific zones in components, extracting failure mechanisms based on measured performance, and allowing extraction of degradation laws so an accurate lifetime distribution can be proposed