Surface Analysis of Polymers by XPS and Static SIMS

by D. Briggs

Overview

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.

Product Details

ISBN-13:	9780521352222
Publisher:	Cambridge University Press
Publication date:	04/02/1998
Series:	Cambridge Solid State Science Series
Pages:	214
Product dimensions:	7.01(w) x 10.00(h) x 0.51(d)

Table of Contents

1. Introduction; 2. X-ray photoelectron spectroscopy (XPS); 3. Information from polymer XPS; 4. Static secondary ion mass spectrometry (SSIMS); 5. Information from SSIMS; 6. Polymer surface analysis case studies; References.

Editorial Reviews

"...written by one of those that mostly contributed to the development of the field...valuable to academic and industrial researchers interested to be introduced in the field." Polymer News

From the Publisher