Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods

Algorithms for intelligent fault diagnosis of automated operations offer significant benefits to the manufacturing and process industries. Furthermore, machine learning methods enable such monitoring systems to handle nonlinearities and large volumes of data.

This unique text/reference describes in detail the latest advances in Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods. Abundant case studies throughout the text demonstrate the efficacy of each method in real-world settings. The broad coverage examines such cutting-edge topics as the use of information theory to enhance unsupervised learning in tree-based methods, the extension of kernel methods to multiple kernel learning for feature extraction from data, and the incremental training of multilayer perceptrons to construct deep architectures for enhanced data projections.

Topics and features: reviews the application of machine learning to process monitoring and fault diagnosis; discusses machine learning frameworks based on artificial neural networks, statistical learning theory and kernel-based methods, and tree-based methods; examines the application of machine learning to steady state and dynamic operations, with a focus on unsupervised learning; describes the use of spectral methods in process fault diagnosis.

This highly practical and clearly-structured work is an invaluable resource for all researchers and practitioners involved in process control, multivariate statistics and machine learning.

1114977003
Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods

Algorithms for intelligent fault diagnosis of automated operations offer significant benefits to the manufacturing and process industries. Furthermore, machine learning methods enable such monitoring systems to handle nonlinearities and large volumes of data.

This unique text/reference describes in detail the latest advances in Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods. Abundant case studies throughout the text demonstrate the efficacy of each method in real-world settings. The broad coverage examines such cutting-edge topics as the use of information theory to enhance unsupervised learning in tree-based methods, the extension of kernel methods to multiple kernel learning for feature extraction from data, and the incremental training of multilayer perceptrons to construct deep architectures for enhanced data projections.

Topics and features: reviews the application of machine learning to process monitoring and fault diagnosis; discusses machine learning frameworks based on artificial neural networks, statistical learning theory and kernel-based methods, and tree-based methods; examines the application of machine learning to steady state and dynamic operations, with a focus on unsupervised learning; describes the use of spectral methods in process fault diagnosis.

This highly practical and clearly-structured work is an invaluable resource for all researchers and practitioners involved in process control, multivariate statistics and machine learning.

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Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods

Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods

by Chris Aldrich, Lidia Auret
Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods

Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods

by Chris Aldrich, Lidia Auret

eBook2013 (2013)

$119.00 

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Overview

Algorithms for intelligent fault diagnosis of automated operations offer significant benefits to the manufacturing and process industries. Furthermore, machine learning methods enable such monitoring systems to handle nonlinearities and large volumes of data.

This unique text/reference describes in detail the latest advances in Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods. Abundant case studies throughout the text demonstrate the efficacy of each method in real-world settings. The broad coverage examines such cutting-edge topics as the use of information theory to enhance unsupervised learning in tree-based methods, the extension of kernel methods to multiple kernel learning for feature extraction from data, and the incremental training of multilayer perceptrons to construct deep architectures for enhanced data projections.

Topics and features: reviews the application of machine learning to process monitoring and fault diagnosis; discusses machine learning frameworks based on artificial neural networks, statistical learning theory and kernel-based methods, and tree-based methods; examines the application of machine learning to steady state and dynamic operations, with a focus on unsupervised learning; describes the use of spectral methods in process fault diagnosis.

This highly practical and clearly-structured work is an invaluable resource for all researchers and practitioners involved in process control, multivariate statistics and machine learning.


Product Details

ISBN-13: 9781447151852
Publisher: Springer London
Publication date: 06/15/2013
Series: Advances in Computer Vision and Pattern Recognition
Sold by: Barnes & Noble
Format: eBook
Pages: 374
File size: 9 MB

About the Author

L. Santiago Medina, MD, MPH, is Co-Director, Division of Neuroradiology-Neuroimaging, and Director, Health Outcomes, Policy, and Economics (HOPE) Center at Miami Children's Hospital.
Jeffrey G. Jarvik, MD, MPH,is the Professor of Radiology and Neurological Surgery, Adjunct Associate Professor of Health Services, and Director of Radiology Health Service Research Section at the University of Washington School of Medicine.
Pina C. Sanelli, MD, MPH,is Associate Professor of Radiology and is also Associate Professor of Public Health at Weill Cornell Medical College. She is an Associate Attending Radiologist at the NewYork-Presbyterian Hospital-Weill Cornell Campus. Dr. Sanelli is a member of the Division of Neuroradiology. Her clinical expertise is in neuroradiological and spine imaging and procedures including MRI, MRA, CT, and CTA.

Table of Contents

Introduction

Overview of Process Fault Diagnosis

Artificial Neural Networks

Statistical Learning Theory and Kernel-Based Methods

Tree-Based Methods

Fault Diagnosis in Steady State Process Systems

Dynamic Process Monitoring

Process Monitoring Using Multiscale Methods

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