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Title: Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard, Author: Adam Osseiran
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Analog and Mixed-Signal…
by Adam Osseiran (Editor)
#16 in Series
eBook $159.00
Title: In-Circuit Testing, Author: John T. Bateson
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In-Circuit Testing
by John T. Bateson
Paperback $54.99