Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,

by Lawrence E Murr (Editor)

Overview

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Product Details

ISBN-13:	9781351830294
Publisher:	CRC Press
Publication date:	10/08/2018
Series:	Optical Science and Engineering
Sold by:	Barnes & Noble
Format:	eBook
Pages:	856
File size:	34 MB
Note:	This product may take a few minutes to download.

About the Author

Lawrence E. Murr

Table of Contents

CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.