Table of Contents
List of contributors ix
Woodhead Publishing Series in Electronic and Optical Materials xi
Foreword xv
1 Introduction J. Swingler 1
1.1 Introduction 1
1.2 The focus of the book 1
1.3 Reliability science and engineering fundamentals (Chapters 2-4) 3
1.4 Reliability methods in component and system development (Chapters 5-9) 6
1.5 Reliability modelling and testing in specific applications (Chapters 10 and 11) 8
1.6 Conclusion 9
References 10
2 Reliability and stupidity: mistakes in reliability engineering and how to avoid them R.W.A. Barnard 11
2.1 Introduction 11
2.2 Common mistakes in reliability engineering 12
2.3 Conclusion 24
References 24
3 Physics-of-failure (PoF) methodology for electronic reliability C. Hendricks E. George M. Osternum M. Pecht 27
3.1 Introduction 27
3.2 Reliability 27
3.3 PoF models 29
3.4 PoF reliability assessment 32
3.5 Applications of PoF to ensure reliability 34
3.6 Summary and areas of future interest 37
References 38
4 Modern instruments for characterizing degradation in electrical and electronic equipment P.D. Goodman R. Skipper N. Aitken 43
4.1 Introduction 43
4.2 Destructive techniques 43
4.3 Nondestructive techniques 52
4.4 In situ measurement techniques 57
4.5 Conclusions 61
References 62
5 Reliability building of discrete electronic components T.-M.I. Bäjenescu M.I. Bazu 63
5.1 Introduction 63
5.2 Reliability building 63
5.3 Failure risks and possible corrective actions 67
5.4 Effect of electrostatic discharge on discrete electronic components 78
5.5 Conclusions 79
References 79
6 Reliability of optoelectronics J.-S. Huang 83
6.1 Introduction 83
6.2 Overview of optoelectronics reliability 84
6.3 Approaches and recent developments 85
6.4 Case study: reliability of buried heterostructure (BH) InP semiconductor lasers 90
6.5 Reliability extrapolation and modeling 98
6.6 Electrostatic discharge (ESD) and electrical overstress (EOS) 101
6.7 Conclusions 109
References 115
7 Reliability of silicon integrated circuits A.S. Oates 115
7.1 Introduction 115
7.2 Reliability characterization approaches 116
7.3 Integrated circuit (IC) wear-out failure mechanisms 118
7.4 Summary and conclusions 133
Acknowledgments 135
References 135
8 Reliability of emerging nanodevices N. Raghavan, K.L. Pey 143
8.1 Introduction lo emerging nanodevices 143
8.2 Material and architectural evolution of nanodevices 146
8.3 Failure mechanisms in nanodevices 148
8.4 Reliability challenges: opportunities and issues 160
8.5 Summary and conclusions 163
References 163
9 Design considerations for reliable embedded systems R.A. Shafik A. Das S. Yang G. Merrett B.M. Al-Hashimi 169
9.1 Introduction 169
9.2 Hardware faults 170
9.3 Reliable design principles 173
9.4 Low-cost reliable design 180
9.5 Future research directions 187
9.6 Conclusions 190
References 190
10 Reliability approaches for automotive electronic systems D. Medhat 195
10.1 Introduction 195
10.2 Circuit reliability challenges for the automotive industry 195
10.3 Circuit reliability checking for the automotive industry 196
10.4 Using advanced electronic design automation (EDA) tools 200
10.5 Case studies and examples 208
10.6 Conclusion 212
Acknowledgment 212
References 212
11 Reliability modeling and accelerated life testing for solar power generation systems F. Schenkelberg 215
11.1 Introduction 215
11.2 Overview 215
11.3 Challenges 218
11.4 Modeling 222
11.5 Accelerated life testing (ALT) 226
11.6 ALT example: how to craft a thermal cycling ALT plan for SnAgCu (SAC) solder failure mechanism 238
11.7 How to craft a temperature, humidity, and bias ALT plan for CMOS metallization corrosion 243
11.8 Developments and opportunities 247
11.9 Conclusions 248
11.10 Sources of further information 248
References 248
Index 251
