Microanalysis of Solids / Edition 1

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This book systematically describes the most widely used techniques for the microanalysis of the physical, structural, and compositional properties of solids. Covering electron beams, ion beams, photon beams, and acoustic waves, it will provide physicists, materials scientists, electrical engineers, chemists, and their students with a comprehensive reference source.

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Editorial Reviews

As a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid- state materials, this comprehensive volume describes the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approximately 1 micron or less. The techniques are grouped according to the means of excitation: electron beam techniques, ion beam techniques, photon beam techniques, acoustic wave excitation, and tunneling of electrons and scanning probe microscopies. Annotation c. Book News, Inc., Portland, OR (booknews.com)
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Product Details

  • ISBN-13: 9780306444333
  • Publisher: Springer US
  • Publication date: 2/28/1994
  • Edition description: 1994
  • Edition number: 1
  • Pages: 460
  • Product dimensions: 1.06 (w) x 6.14 (h) x 9.21 (d)

Table of Contents

An Introduction to Microanalysis of Solids; B.G. Yacobi, D.B. Holt. Scanning Electron Microscopy; B.G. Yacobi, D.B. Holt. Transmission Electron Microscopy; A.J. Garratt-Reed. Augur Electron Spectroscopy; L.L. Kazmerski. Secondary Ion Mass Spectrometry; S.E. Asher. Applications of MeV Ion Beams in Materials Analysis; P. Revesz, J. Li. Confocal Microscopy; T. Wilson. XRay Microscopy; A.G. Michette, A.C. Potts. XRay Photoemission Spectroscopy; A. Nelson. Laser Ionization Mass Spectrometry; R.W. Odom, F. Radicati di Brozolo. Microellipsometry; R.F. Cohn. Scanning Acoustic Microscopy; P. Mutti, G.A.D. Briggs. Field Emission, Field Ion Microscopy, and the Atom Probe; J.J. Hren, J. Liu. Scanning Probe Microscopy; D.A. Grigg, P.E. Russell. Index.

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