Advances in Imaging and Electron Physics

by Peter W. Hawkes (Editor)

Overview

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading authorities
• Informs and updates on all the latest developments in the field

Product Details

ISBN-13:	9780123946355
Publisher:	Elsevier Science & Technology Books
Publication date:	12/31/2012
Series:	Advances in Imaging and Electron Physics , #171
Sold by:	Barnes & Noble
Format:	eBook
Pages:	440
File size:	15 MB
Note:	This product may take a few minutes to download.

About the Author

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

In 1982, he took over editorship of the Advances in Electronics&Electron Physics (now Advances in Imaging&Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.

In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the International and European Congresses on electron microscopy as well as three Pfefferkorn conferences.

He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Table of Contents

1. Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence

G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler

2. Thermal Imaging in Medicine

Lila Iznita Izhar and Maria Petrou

3. Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review

Jean-Michel Tualle

4. Imaging Mass Spectrometry – Sample Preparation, Instrumentation and Applications

Kamlesh Shrivas and Mitsutoshi Setou

5. Transformation Optics

Robert T. Thompson and Steven A. Cummer

6. TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications

Tobias Klein, Egbert Buhr and Carl Georg Frase

7. Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics

M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah

What People are Saying About This

From the Publisher

Volume 132 in this prestigeous series!

Editorial Reviews

The four surveys contained in this volume illustrate widely diverse aspects of imaging and electron physics. The first two chapters address applications of electron microscopy, including the role of this technique in mineralogy and a study of the high- resolution electron microscopy of quasicrystals. The latter is actually a short monograph presenting the underlying crystallography and explaining in detail how the corresponding images and diffraction patterns should be interpreted. The third contribution is an account of a new approach to deconvolution in image processing in which the author, by associating a polynomial with the gray-level values of (discrete) images, shows that it is possible to invert the convolutional relation that describes many kinds of image formation. The volume ends with a detailed discussion of the dual de Broglie wave, including a critical account of new developments in the debate over the existence and role of such a wave. Annotation c. by Book News, Inc., Portland, Or.

Booknews

"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."—MRS BULLETIN"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE

From the Publisher