Characterization of Nanostructures

by Sverre Myhra, John C. Rivière

Overview

The techniques and methods that can be applied to materials characterization on the microscale are numerous and well-established. Divided into two parts, Characterization of Nanostructures provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures, and discusses typical applications to single nanoscale o

Product Details

ISBN-13:	9781040204146
Publisher:	CRC Press
Publication date:	06/12/2012
Sold by:	Barnes & Noble
Format:	eBook
Pages:	350
File size:	26 MB
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About the Author

Sverre Myhra and John Riviere are affiliated with Oxford University, UK.

Table of Contents

Introduction to Characterization of Nanostructures. Techniques and Methods: Electron-Optical Imaging of Nanostructures ((HR)TEM, STEM, and SEM). Electron-Optical Analytical Techniques. Photon-Optical Spectroscopy-Raman and Fluorescence. Scanning Probe Techniques and Methods. Techniques and Methods for Nanoscale Analysis of Single C60 and Other Cage Structures. Applications: Quantum Dots and Related Structures. Carbon Nanotubes and Other Tube Structures. Nanowires. Graphene and Other Monolayer Structures. Nanostructures-Strategic and Tactical Issues.

Editorial Reviews

"This book provides an understanding of the fundamental concepts of characterisation techniques for nanomaterials such as graphene, fullerenes, carbon nanotubes and quantum dots. The authors have nicely presented the complex theory of the physical techniques in a simple manner that will have immense benefit for the nanoscience community. … This book will be a valuable asset to students and newcomers to the field. Nanoscience researchers will also benefit as it covers the theory, techniques and applications from basic to advanced levels with up to date bibliographic information."
— Tapas Sen, Chemistry World, April 2013

From the Publisher