Order History
Premium Membership & Rewards
Help Center / FAQ
Digital Holography for MEMS and Microsystem Metrology
By Anand Asundi
eBook
$118.00
By Anand Asundi
Collect stamps to save with Rewards. 10 stamps = $5. Learn More
Select a store to view item availability.
Available on compatible , the free NOOK App, and in My Digital Library
NOOK App
Download NOOK app
NOOK Devices
NOOK eReaders
- NOOK GlowLight 4 Plus
- NOOK GlowLight 4e
- NOOK GlowLight 4
- NOOK GlowLight Plus 7.8"
- NOOK GlowLight 3
- NOOK GlowLight Plus 6"
NOOK Tablets
- NOOK 9" Lenovo Tablet
- NOOK 10" HD Lenovo Tablet
- NOOK Tablet 7" & 10.1"
- NOOK by Samsung Galaxy Tab 7.0 [Tab A and Tab 4]
- NOOK by Samsung [Tab 4 10.1, S2 & E]
Free NOOK Reading Apps
- NOOK for iOS
- NOOK for Android
BN.com website
Go to your Digital Library in My Account
Limit 1 per customer
Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique c...