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Noncontact Atomic Force Microscopy: Volume 2

By Seizo Morita (Editor), Franz J. Giessibl (Editor), Roland Wiesendanger (Editor)
Paperback
$249.99
By Seizo Morita (Editor), Franz J. Giessibl (Editor), Roland Wiesendanger (Editor)
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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and techn...

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