Solid State Device Physics (third edition)

This book documents physics and 7 experiments on electronic devices like never before (to our knowledge). The experiments cover the room-temperature I-V characteristics of an NPN Bipolar Junction Transistor (BJT) C828 in common-base and common-emitter configurations; an n-channel Junction Field Effect Transistor (n-JFET) 2N5457 in common-source configuration; and a Uni-junction Transistor (UJT) 2N493. The other 3 experiments cover the design, construction, and implementation of a common-emi...