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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

By Antïnio Manuel Lourenïo Canelas, Jorge Manuel Correia Guilherme, Nuno Cavaco Gomes Horta
eBook
$99.00
By Antïnio Manuel Lourenïo Canelas, Jorge Manuel Correia Guilherme, Nuno Cavaco Gomes Horta
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This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The me...

Categories

EngineeringElectrical & Electronic EngineeringElectronics - Circuits - GeneralElectronic circuits