ADV MATH & COMP TOOL METROL XI
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$134.00
By Alistair B Forbes (Editor), Nien Fan Zhang (Editor), Anna G Chunovkina (Editor), Sascha Eichstadt (Editor), Franco Pavese (Editor)
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This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strat...























