C, H, N and O in Si and Characterization and Simulation of Materials and Processes
eBook
$287.00
By A. Borghesi (Editor), U.M. Gösele (Editor), J. Vanhellemont (Editor), A.M. Gué (Editor), M. Djafari-Rouhani (Editor)
Collect stamps to save with Rewards. 10 stamps = $5. Learn More
Select a store to view item availability.
Available on compatible , the free NOOK App, and in My Digital Library
NOOK App
Download NOOK app
NOOK Devices
NOOK eReaders
- NOOK GlowLight 4 Plus
- NOOK GlowLight 4e
- NOOK GlowLight 4
- NOOK GlowLight Plus 7.8"
- NOOK GlowLight 3
- NOOK GlowLight Plus 6"
NOOK Tablets
- NOOK 9" Lenovo Tablet
- NOOK 10" HD Lenovo Tablet
- NOOK Tablet 7" & 10.1"
- NOOK by Samsung Galaxy Tab 7.0 [Tab A and Tab 4]
- NOOK by Samsung [Tab 4 10.1, S2 & E]
Free NOOK Reading Apps
- NOOK for iOS
- NOOK for Android
BN.com website
Go to your Digital Library in My Account
Containing over 200 papers, this volume contains the proceedings of two symposia in the E-MRS series. Part I presents a state of the art review of the topic - Carbon, Hydrogen, Nitrogen and Oxygen in Silicon and in Other Elemental Semiconductors. There was strong representation from the industrial laboratories, illustrating that the topic is highly relevant for the semiconductor industry.The second part of the volume deals with a topic which is undergoing a process of convergence with two c...























