Premium & Rewards Members 25% Off Pre-Order Books With Code PREORDER25 Ends 6/26 Shop Now Online only. See page for details.Premium & Rewards Members 25% Off Pre-Order Books With Code PREORDER25 Ends 6/26 Shop Now Online only. See page for details.
Add Item to wish listAdd Item to wish list

Electrical Overstress (EOS): Devices, Circuits and Systems

By Steven H. Voldman
eBook
$109.95
By Steven H. Voldman
Membership Card Icon
Collect stamps to save with Rewards. 10 stamps = $5. Learn More
Formats
Select a store to view item availability.

Available on compatible , the free NOOK App, and in My Digital Library

NOOK App

Download NOOK app

NOOK Devices

NOOK eReaders

  • NOOK GlowLight 4 Plus
  • NOOK GlowLight 4e
  • NOOK GlowLight 4
  • NOOK GlowLight Plus 7.8"
  • NOOK GlowLight 3
  • NOOK GlowLight Plus 6"

NOOK Tablets

  • NOOK 9" Lenovo Tablet
  • NOOK 10" HD Lenovo Tablet
  • NOOK Tablet 7" & 10.1"
  • NOOK by Samsung Galaxy Tab 7.0 [Tab A and Tab 4]
  • NOOK by Samsung [Tab 4 10.1, S2 & E]

Free NOOK Reading Apps

  • NOOK for iOS
  • NOOK for Android

BN.com website

Go to your Digital Library in My Account

Limit 1 per customer
Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufac...

Categories

EngineeringElectrical & Electronic EngineeringElectronics - Circuits - GeneralElectronics - Circuits * General