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Electromigration and Electronic Device Degradation

By Aris Christou (Editor)
Hardcover
$285.95
By Aris Christou (Editor)

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Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.

Categories

Science & TechnologyEngineeringElectrical & Electronic EngineeringElectronics - Circuits - IntegratedElectronics - Semiconductors