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Electromigration in Thin Films and Electronic Devices: Materials and Reliability

By Choong-Un Kim (Editor)
eBook
$250.00
By Choong-Un Kim (Editor)
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Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. Electromigration in thin films and electronic devices provides an up-to-date review of key topics in this commercially important area.Part one consists of three introductory chapters, covering modelling of electromigration phenomena, modelling electromigration using the peridynamics approach and simulation and x-ray microbeam studies o...

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Science & TechnologyEngineeringElectrical & Electronic EngineeringElectronics - General & Miscellaneous