High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

by R. Dean Adams

Overview

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Product Details

ISBN-13:	9781402072550
Publisher:	Springer US
Publication date:	09/30/2002
Series:	Frontiers in Electronic Testing , #22
Edition description:	2003
Pages:	250
Product dimensions:	6.10(w) x 9.25(h) x 0.24(d)

Table of Contents

Test of Memories.- Opening Pandora’s Box.- Static Random Access Memories.- Multi-Port Memories.- Silicon On Insulator Memories.- Content Addressable Memories.- Dynamic Random Access Memories.- Non-Volatile Memories.- Memory Testing.- Memory Faults.- Memory Patterns.- Memory Self Test.- BIST Concepts.- State Machine BIST.- Micro-Code BIST.- BIST and Redundancy.- Design For Test and BIST.- Conclusions.

What People are Saying About This

Koenemann, Bernard

Embedded memories contain more transistors than any other element of modern system chips. Bit densities and performance are so critical that memory designs often stretch the limits of design rules and process capabilities. As a result, embedded memories attract unique defective behaviors that tend to make them yield limiters with critical impact on manufacturability and cost. High Performance Memory Testing is the first book that truly brings together the most relevant insights into memory design and manufacturing principles with how each embedded memories can be tested, diagnosed and repaired according to their unique design and process characteristics. With so much of modern system chips riding on embedded memories, this book is a must-read for all chip designers, test and manufacturing engineers, and the managers responsible for the success and cost of the chip projects.
— Manager, IBM Design for Test

Editorial Reviews

From the reviews:

"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)

From the Publisher