Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes / Edition 1

Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes / Edition 1

by Nagamitsu Yoshimura
ISBN-10:
443154447X
ISBN-13:
9784431544470
Pub. Date:
09/20/2013
Publisher:
Springer Japan

Paperback - Rent for

Select a Purchase Option (2014)
  • purchase options
    $47.18 $54.99 Save 14% Current price is $47.18, Original price is $54.99. You Save 14%.
  • purchase options

Overview

Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes / Edition 1

This book describes the developmental history of the vacuum system of the transmission electron microscope (TEM) at the Japan Electron Optics Laboratory (JEOL) from its inception to its use in today’s high-technology microscopes. The author and his colleagues were engaged in developing vacuum technology for electron microscopes (JEM series) at JEOL for many years. This volume presents a summary and explanation of their work and the technology that makes possible a clean ultrahigh vacuum.

The typical users of the TEM are top-level researchers working at the frontiers of new materials or with new biological specimens. They often use the TEM under extremely severe conditions, with problems sometimes occurring in the vacuum system of the microscopes. JEOL engineers then must work as quickly as possible to improve the vacuum evacuation system so as to prevent the recurrence of such problems. Among the wealth of explanatory material in this book are examples of users’ reports of problems in the vacuum system of the JEM, such as the occurrence of a micro-discharge and the back-streaming of the diffusion pump (DP) oil vapor.

This work is a valuable resource for researchers who use the transmission electron microscope and for engineers and scientists interested in its technology.

Product Details

ISBN-13: 9784431544470
Publisher: Springer Japan
Publication date: 09/20/2013
Series: SpringerBriefs in Applied Sciences and Technology Series
Edition description: 2014
Pages: 125
Product dimensions: 6.10(w) x 9.25(h) x 0.02(d)

Table of Contents

Introduction of the electron microscope.- History of JEOL electron microscopes.- Accidents and information, instructing us to improve the vacuum systems of JEMs.- Development of the evacuation systems for JEMs.- Development of JEOL SIPs.- Ultrahigh vacuum electron microscopes.

Customer Reviews

Most Helpful Customer Reviews

See All Customer Reviews