There's still time! Find the perfect Father's Day gift with store pickup | Shop NowThere's still time! Find the perfect Father's Day gift with store pickup | Shop Now
Add Item to wish listAdd Item to wish list

Measurement Technology for Micro-Nanometer Devices

By Wendong Zhang, Xiujian Chou, Tielin Shi, Zongmin Ma, Haifei Bao, Jingdong Chen, Liguo Chen, Dachao Li, Chenyang Xue
eBook
$134.00
By Wendong Zhang, Xiujian Chou, Tielin Shi, Zongmin Ma, Haifei Bao, Jingdong Chen, Liguo Chen, Dachao Li, Chenyang Xue
Membership Card Icon
Collect stamps to save with Rewards. 10 stamps = $5. Learn More
Formats
Select a store to view item availability.

Available on compatible , the free NOOK App, and in My Digital Library

NOOK App

Download NOOK app

NOOK Devices

NOOK eReaders

  • NOOK GlowLight 4 Plus
  • NOOK GlowLight 4e
  • NOOK GlowLight 4
  • NOOK GlowLight Plus 7.8"
  • NOOK GlowLight 3
  • NOOK GlowLight Plus 6"

NOOK Tablets

  • NOOK 9" Lenovo Tablet
  • NOOK 10" HD Lenovo Tablet
  • NOOK Tablet 7" & 10.1"
  • NOOK by Samsung Galaxy Tab 7.0 [Tab A and Tab 4]
  • NOOK by Samsung [Tab 4 10.1, S2 & E]

Free NOOK Reading Apps

  • NOOK for iOS
  • NOOK for Android

BN.com website

Go to your Digital Library in My Account

Limit 1 per customer
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale

• Highlights the advanced research work from industry and academia in micro-nano devices test technology
• Written at both introductory and advanced levels, provides the fundamentals and theories
• Focuses on the measurement techniques for characterizing MEMS/NEMS devices

Categories

Science & TechnologyEngineeringElectrical & Electronic EngineeringApplied ScienceElectronics - MicroelectronicsMeasurements - Physical