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Modern Interferometry for Length Metrology: Exploring limits and novel techniques
By René Schödel (Editor), Florian Pollinger (Contribution by), Arnold Nicolaus (Contribution by), Guido Bartl (Contribution by), Thilo Schuldt (Contribution by), Nandini Bhattacharya (Contribution by), Steven van den Berg (Contribution by), Seung-Woo Kim (Contribution by), Yoon-Soo Jang (Contribution by), Armin Reichhold (Contribution by), Birk Andreas (Contribution by), Christoph Weichert (Contribution by)
eBook
$150.00
By René Schödel (Editor), Florian Pollinger (Contribution by), Arnold Nicolaus (Contribution by), Guido Bartl (Contribution by), Thilo Schuldt (Contribution by), Nandini Bhattacharya (Contribution by), Steven van den Berg (Contribution by), Seung-Woo Kim (Contribution by), Yoon-Soo Jang (Contribution by), Armin Reichhold (Contribution by), Birk Andreas (Contribution by), Christoph Weichert (Contribution by)
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Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic co...