RF Imperfections in High-rate Wireless Systems: Impact and Digital Compensation / Edition 1

by Tim Schenk

Overview

This book takes a modern, multidisciplinary view on radio system - sign: the advantages of digital signal processing are exploited to satisfy the ever increasing demands on better performing,—exible radio f- quency (RF) circuits. By accepting that analog circuits are inherently imperfect, but by searching for methods to mitigate and compensate for this, significant steps can be made to improve the overall system so- tion. This is in contrast to the more traditional approach of designing RF circuits themselves to satisfy the demanding specifications set by current standards. Wireless communication has progressed dramatically in past years. Yet, the main research challenges changed focus to sustain this growth over many decades. In the early days, the main challenge of radio c- munications was to cover large distances. When in late 1980s, digital mobile communication emerged as a precursor to today’s mass-market cell phones, the priority shifted to achieving reliable communication over a difficult, i. e. , time-varying and frequency-selective mobile ch- nel. About a decade or research in many institutes around the world has been devoted to this challenge, exploiting the opportunities given by increasing computational power in digital circuits. Today we face a different paradigm: the technology for analog front-ends progress sign- icantly slower than that of digital processors. So the imperfections of the RF have increasingly become the major bottleneck in our drive - wards faster, yet more power-efficient radio circuits.

Product Details

ISBN-13:	9789048177578
Publisher:	Springer Netherlands
Publication date:	11/29/2010
Edition description:	Softcover reprint of hardcover 1st ed. 2008
Pages:	320
Product dimensions:	6.10(w) x 9.25(h) x 0.24(d)

Table of Contents

Multiple-antenna OFDM systems.- Design and implementation of a MIMO OFDM system.- Phase Noise.- IQ Imbalance.- Nonlinearities.- A generalised error model.- Discussion and conclusions.