Premium & Rewards Members Earn Double Stamps Shop Now Ends 7/5Premium & Rewards Members Earn Double Stamps Shop Now Ends 7/5
Add Item to wish listAdd Item to wish list

Semiconductor Device Reliability

By A. Christou (Editor), B.A. Unger (Editor)
Paperback
$359.00
By A. Christou (Editor), B.A. Unger (Editor)
Coin

Now through 9/7, Premium & Rewards Members Earn Double Stamps! 10 stamps = $5 reward.

Promotion message icon

Premium Members save an extra 10% and all Members collect stamps to save with Rewards. 10 stamps = $5.

Formats
See All Formats & Editions
In stock
This item is currently out of stock online.
Free standard shipping on orders over $60
Select a store to view item availability.
This publication is a compilation of papers presented at the Semiconductor Device Reliabi­ lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and ...

Categories

Science & TechnologyEngineeringElectrical & Electronic EngineeringElectronics - General & MiscellaneousElectronics - Semiconductors